Probe Stations

SEMI-AUTOMATIC PROBE STATIONS

A probe station is used to physically acquire signals from the internal nodes of a semiconductor device. The probe station utilizes manipulators which allow the precise positioning of thin needles on the surface of the semiconductor device. If the device is being electrically stimulated, the signal is acquired by the mechanical probe and is displayed on an oscilloscope.

Probe stations enable physical scientists and researchers to conduct fundamental science through convenient, repeatable measurements producing consistent results. Probe stations are versatile and flexible research platforms that can support a wide variety of applications such as I-V/C-V, radio frequency (RF), millimeter-wave (mmW) and sub-THz measurements, device and wafer characterization tests (DWC), wafer level reliability, failure analysis (FA), modeling, yield enhancement, submicron probing, MEMS, optoelectronic engineering tests and more.

RotaLab provides semi-automated probe systems with probing capabilities ranging from 50 mm to 450 mm wafers/substrates. Our wafer prober systems are integrated with state-of-the-art technology to allow you to work efficiently and effectively in your research and industrial applications.

  • PS4L SA-4


    [100 mm chuck]
    Model PS4L SA-4 semi-automated probe station with 100 mm chuck size | SEMIPROBE Turkey

  • PS4L SA-6


    [150 mm chuck]
    Model PS4L SA-6 semi-automated probe station with 150 mm chuck size | SEMIPROBE Turkey

  • PS4L SA-8


    [200 mm chuck]
    Model PS4L SA-8 semi-automated probe station with 200 mm chuck size | SEMIPROBE Turkey

  • PS4L SA-12


    [300 mm chuck]
    Model PS4L SA-12 semi-automated probe station with 300 mm chuck size | SEMIPROBE Turkey
Specialty Probe Stations

  • SA-4VP


    [vacuum prober]
    Model SA-4VP semi-automated vacuum wafer probe station for up to 100 mm wafer size | SEMIPROBE Turkey

  • SA-6VP


    [vacuum prober]
    Model SA-6VP semi-automated vacuum wafer probe station for up to 150 mm wafer size | SEMIPROBE Turkey

  • SA-8VP


    [vacuum prober]
    Model SA-8VP semi-automated vacuum wafer probe station for up to 200 mm wafer size | SEMIPROBE Turkey

  • DSP SA


    [double sided prober]
    Model DSP SA manual probe station for contacting of active devices on both sides of the wafer | SEMIPROBE Turkey