MICROSCOPIC-SPOT MEASUREMENT SYSTEMS

The microscopic-spot product family is for applications that require measurement of spots with sizes less than 4 micron (µm). Our systems can analyze up to more than one-million spots. Thickness and refractive index can still be measured in less than a second. You can use your own microscope for measurements or let us supply the entire system.

All desktop film thickness measurement instruments provided by RotaLab can connect to the USB port of your Windows™ or Mac™ OS based computer and sets up in minutes.

  • MProbe® 40
    [UV-Vis-NIR]


    MProbe 40 (MSP) is a spectroscopic reflectance system designed for thin-film thickness using a fiber optics retro-reflecting probe and microscope | SEMICONSOFT Turkey
Accessories

  • Motorized XY Mapping Stage


    XY Mapping Stage allows to measure thin film thickness, uniformity and other parameters across the surface of the sample | SEMICONSOFT Turkey